TAILORED SPM PROBES FOR DUAL-TIP FORCE MICROSCOPY

1 ŠOLTÝS Ján
Co-authors:
1 PRECNER Marián 1 FEDOR Ján 1 CAMBEL Vladimír
Institution:
1 lEE SAS – Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, Slovak Republic, EU
Conference:
9th International Conference on Nanomaterials - Research & Application, Hotel Voronez I, Brno, Czech Republic, EU, October 18th - 20th 2017
Proceedings:
Proceedings 9th International Conference on Nanomaterials - Research & Application
Pages:
759-764
ISBN:
978-80-87294-81-9
ISSN:
2694-930X
Published:
8th March 2018
Proceedings of the conference were published in Web of Science and Scopus.
Metrics:
19 views / 2 downloads
Abstract

This work reports on two novel SPM methods which both use tailored dual AFM tips. The first method, so called dual-tip magnetic force microscopy (DT-MFM), is based on two-pass scanning with switching nonmagnetic and magnetic tip during the scan. Thanks to segregation of topological and magnetic scans using two different tips this technique reduces invasion of high local magnetization of the tip apex and is suitable for soft magnetic sample. The second method, so called dual-tip force spectroscopy (DT-FS), is based on special dual-probe for bio-applications to study the mechanical properties of cells. It consists of two cantilevers; one having a sharp tip, the other having a spherically blunted tip. The sharp tip is used for topography imaging with high resolution, while blunt tip is used for measuring of force distance curves. The larger area of probe-cell contact results in averaging local variation in the cell rigidity compared to the one measured with a regular sharp probe. The switching between sharp and blunt tip is realized by means of integrated magnetostrictive actuator.

Keywords: AFM probes, dual-tip, magnetic force microscopy, force spectroscopy
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