from the conferences organized by TANGER Ltd.
The determination of porosity in thin, highly porous films is essential for many technological applications. For evaluating the porosity of materials, various methods have been developed. In this study, Rutherford Backscattering was used to analyze a thin layer of black silver at several angles of the probing beam. Through careful simulation of the energy spectra using a MC SIMNRA code, depth profiles of the constituent atoms were determined, enabling the quantification of both the total and directional relative occupancy of Ag in the layer. This provided a new (albeit simplified) perspective on the porous structures, allowing for the evaluation of Ag porosity distribution within the layer. The samples were prepared at the University of Chemistry and Technology in Prague (UCT Prague) by evaporating silver in an Ar ambient atmosphere, while the RBS analyses were conducted at the Tandetron accelerator at the Nuclear Physics Institute in Řež using a 2 MeV alpha particle beam.
Keywords: Black silver, porosity, Rutherford Backscattering, inclination angles, Energy storage systems, ion beam modifications, nanofilms© This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.