SCANNING THERMAL MICROSCOPY OF THERMOELECTRIC PULSED LASER DEPOSITED NANOSTRUCTURES

1,2 VANIŠ Jan
Co-authors:
1 ZELINKA Jiří 1 ZEIPL Radek 1 JELÍNEK Miroslav 1 KOCOUREK Tomáš 1 REMSA Jan 3 NAVRÁTIL Jiří
Institutions:
1 Institute of Physics AS CR, v.v.i., Na Slovance 2, 18221, Prague, Czech Republic, EU
2 Institute of Photonics and Electronics AS CR, v.v.i., Chaberská 57, 18251, Prague, Czech Republic, EU
3 Institute of Macromolecular Chemistry, AS CR, v.v.i., Heyrovského nám. 2, 16206 Prague, Czech Republic, EU
Conference:
7th International Conference on Nanomaterials - Research & Application, Hotel Voronez I, Brno, Czech Republic, EU, October 14th - 16th 2015
Proceedings:
Proceedings 7th International Conference on Nanomaterials - Research & Application
Pages:
655-659
ISBN:
978-80-87294-59-8
ISSN:
2694-930X
Published:
11th January 2016
Proceedings of the conference were published in Web of Science and Scopus.
Metrics:
16 views / 4 downloads
Abstract

New materials with high possible figure of merit ZT are of high interest as a promising candidates for thermoelectric applications such as energy harvesting. Miniaturization of such systems tends toward developing of the suitable characterization method with nanometer resolution ability. In our contribution, we present the development and experimental results of a simple scanning probe microscopy method for the relative thermal conductivity characterization. The possibility of the setup is demonstrated on the set of different thin thermoelectric layers grown from hot pressed targets by pulsed laser deposition on the reference Si substrate. All the measurements were performed on the commercial Veeco Multimode scanning AFM/STM microscope with home developed controller and by using PicoCal Inc. bolometer probes with tungsten resistive path. All the experiments were done in the air at the ambient condition. Additional sample treatment for the measurement will be also briefly described

Keywords: scanning thermal microscopy, figure of merit, thermoeletric materials
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