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High-pressure high-temperature nanodiamonds (NDs) with hydrogen and oxygen surface termination are deposited on ITO coated glass substrates as well as on gold layers. Scanning probe microscopy is used for characterization of their microscopic electrical and electronic properties. Namely, conductive AFM was used to detect electric conductivity of NDs which prove that they act similarly to bulk diamond: hydrogen terminated NDs are electrically conductive whereas oxygen terminated NDs are electrically insulating. Work function (WF) of the ND-TCO systems were characterized by Kelvin probe force microscopy. It turned out, that WF of NDs on ITO is not stable in time. WF of H-NDs on ITO is changed by 150 mV to lower WF within 17 days. WF of O-NDs is varying in the range -250 mV up to +650 mV without any monotonous trend, which reflects their insulating character.
Keywords: Nanodiamonds, ITO, surface termination, Kelvin probe force microscopy, conductive atomic force microscopy, work function© This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.