PRODUCTION AND CHARACTERIZATION OF MICRO-SIZE PORES FOR ION TRACK ETCHING APPLICATIONS

1 CANNAVO’ Antonino
Co-authors:
1 HAVRANEK Vladimir 1 LAVRENTIEV Vasily 2 TORRISI Lorenzo 1 CUTRONEO Mariapompea 1 CECCIO Giovanni 1 TORRISI Alfio 1 HORAK Pavel 1 VACIK Jiri
Institutions:
1 Nuclear Physics Institute, ASCR, Husinec Řež, Czech Republic, EU, cannavo@ujf.cas.cz
2 Dipartimento di Scienze Fisiche – MIFT, Università di Messina, F.S.D’Alcontres 31, 98166, Messina, Italy
Conference:
10th International Conference on Nanomaterials - Research & Application, Hotel Voronez I, Brno, Czech Republic, EU, October 17th - 19th 2018
Proceedings:
Proceedings 10th International Conference on Nanomaterials - Research & Application
Pages:
652-658
ISBN:
978-80-87294-89-5
ISSN:
2694-930X
Published:
28th February 2019
Proceedings of the conference were published in Web of Science and Scopus.
Metrics:
5 views / 4 downloads
Abstract

For many years the applications of ion track etch materials have increased considerably, like charged particles detection, molecular identification with nanopores, ion track filters, magnetic studies with nanowires and so on. Over the materials generally used as track detector, the Poly-Allyl-Diglycol Carbonate (PADC), offers many advantages, like its nearly 100% detection efficiency for charged particle, a high resistance to harsh environment, the lowest detection threshold, a high abrasion resistance and a low production costs. All of these properties have made it particularly attractive material, even if due to its brittleness, obtaining a thin film (less than 500 μm) is still a challenge.In this work, PADC foils have been exposed to α-particles emitted by a thin radioactive source of 241Am and to C ions from the Tandetron 4130 MC accelerator. The latent tracks generated in the polymer have been developed using a standard etching procedure in 6.25 NaOH solution. The dependence of the ion tracks’ geometry on the ion beam energy and fluence has been evaluated combining the information obtained through a semiautomatic computer script that selects the etched ion tracks according to their diameter and mean grey value and nanometric resolution images by atomic force microscopy.

Keywords: PADC polymer, AFM, OM, Image analysis
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