PERIODIC NANOSTRUCTURES ON POLYETHERIMIDE INDUCED BY AFM NANOLITHOGRAPHY

1 JUŘÍK Petr
Co-authors:
1 SLEPIČKA Petr 1 PŘIBYL Matěj 1 ŠVORČÍK Václav
Institution:
1 Department of Solid State Engineering, University of Chemistry and Technology, 166 28 Prague, Czech Republic, petr.jurik@gmail.com
Conference:
8th International Conference on Nanomaterials - Research & Application, Hotel Voronez I, Brno, Czech Republic, EU, October 19th - 21st 2016
Proceedings:
Proceedings 8th International Conference on Nanomaterials - Research & Application
Pages:
389-393
ISBN:
978-80-87294-71-0
ISSN:
2694-930X
Published:
17th March 2017
Proceedings of the conference were published in Web of Science and Scopus.
Metrics:
18 views / 8 downloads
Abstract

In this paper we describe a nanopatterning technique of polyetherimide by scanning with the silicon tip in contact mode of atomic force microscopy. Different applied forces were used for the consecutive scanning of the same sample area. The higher applied load the less consecutive scans are necessary for the pattern formation. The most regular pattern on this aromatic polymer substrate was achieved for the applied load 150 nN. The variation of number of scans leads to increase of surface roughness due to mass transport on the polymer surface. The structure formation mapping contributes strongly to development of new applications using nanostructured polymers, e.g. in tissue engineering or in combination with metallization in selected electronics and metamaterials construction.

Keywords: Polyetherimide, atomic force microscopy pattern, nanostructuring
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