ANALYSIS OF THE CONTENT OF TECHNOLOGY CRITICAL METALS IN THE E-WASTE

1 FORNALCZYK Agnieszka
Co-authors:
1 WILLNER Joanna 2 JABLONSKA-CZAPLA Magdalena 2 GRYGOYC Katarzyna 2 RACHWAL Marzena
Institutions:
1 Silesian University of Technology, Gliwice, Poland, EU, Agnieszka.Fornalczyk@polsl.plJoanna.Willner@polsl.pl
2 Institute of Environmental Engineering, Polish Academy of Sciences, Poland, EU, magdalena.czapla@ipispan.edu.pl, katarzyna.grygoyc@ipispan.edu.pl
Conference:
31st International Conference on Metallurgy and Materials, Orea Congress Hotel Brno, Czech Republic, EU, May 18 - 19, 2022
Proceedings:
Proceedings 31st International Conference on Metallurgy and Materials
Pages:
703-707
ISBN:
978-80-88365-06-8
ISSN:
2694-9296
Published:
30th June 2022
Proceedings of the conference have already been published in Scopus and we are waiting for evaluation and potential indexing in Web of Science.
Metrics:
252 views / 144 downloads
Abstract

The article analyzes the presence of selected metals, classified as Technology Critical Elements (TCE), in electrical and electronic devices. Metals belonging to the group of critical metals (Germanium), strategic metals (Tellurium), and very toxic elements (Thallium) were analyzed. Due to the low content of these metals in e-waste, they are usually ignored during e-waste analysis. This means that these metals belong among the least known metals in the literature on waste recycling. Their presence in e-waste can cause them to focus on the environment during improper processing of e-waste. The article discusses electronic components in which Ge, Te, Tl, and analysis of the possibility of entering the environment during recycling processes, are found. It allows determining the possibility getting of these metals into the environment, during the storage and processing of e-waste (especially in the unit processes of disassembly, separation, and shredding), in the case of uncontrolled electronic waste handling and disposal.

Keywords: E-waste processing, waste electrical, electronic equipment, Technology Critical Element

© This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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