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STUDY OF THE CHROMIUM LAYER USING GDOES, OPTICAL MICROSCOPY AND EDX MICROANALYSIS ON A SCANNING ELECTRON MICROSCOPE

1 VÁŇOVÁ Petra
Co-authors:
1 VONTOROVÁ Jiřina 1 KONEČNÁ Kateřina 1 SLAMOVÁ Karolina
Institution:
1 VSB - Technical University of Ostrava, Ostrava, Czech Republic, EU, jirina.vontorova@vsb.cz
Conference:
30th Anniversary International Conference on Metallurgy and Materials, Brno, Czech Republic, EU, May 26 - 28, 2021
Proceedings:
Proceedings 30th Anniversary International Conference on Metallurgy and Materials
Pages:
606-611
ISBN:
978-80-87294-99-4
ISSN:
2694-9296
DOI:
https://doi.org/10.37904/metal.2021.4189
Published:
15th September 2021
Proceedings of the conference have already been published in Scopus and we are waiting for evaluation and potential indexing in Web of Science.
Metrics:
431 views / 406 downloads
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Abstract

The article compares the methods of analysis of the surface chromium layer on two chromium-plated samples under the same technological conditions. However, both samples were visually different. The base material was analysed using GDOES analysis. The carbon and sulphur contents were refined by elemental analysis. The surface layers were evaluated by optical microscopy, glow discharge optical emission spectrometry (GDOES) and EDX microanalysis on a scanning electron microscope. The microhardness of the chromium layer was also measured. There was about a 10% difference in the thickness of the chromium layer and a 5% difference in its hardness. A more significant proportion of transverse cracks occurred in the layer of one sample. It can lead to more wear and corrosion of the product.

Keywords: Chromium layer, GDOES, scanning electron microscopy, optical microscopy, EDX microanalysis

© This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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