THE INFLUENCE OF THE LASER POWER ON THE UTILITY PROPERTIES OF THE SURFACE ROUGHNESS PARAMETER OF THE OVERHANGS DURING THE SLM PROCES

1 PAGÁČ Marek
Co-authors:
1 HAJNYŠ Jiří 1 MALOTOVÁ Šárka 1 ZLÁMAL Tomáš 1 PETRŮ Jana
Institution:
1 VSB - Technical University of Ostrava, Ostrava, Czech Republic, EU, marek.pagac@vsb.cz, jiri.hajnys@vsb.cz, sarka.malotova@vsb.cz, tomas.zlamal@vsb.cz, jana.petru@vsb.cz
Conference:
27th International Conference on Metallurgy and Materials, Hotel Voronez I, Brno, Czech Republic, EU, May 23rd - 25th 2018
Proceedings:
Proceedings 27th International Conference on Metallurgy and Materials
Pages:
814-819
ISBN:
978-80-87294-84-0
ISSN:
2694-9296
Published:
24th October 2018
Proceedings of the conference were published in Web of Science and Scopus.
Metrics:
323 views / 191 downloads
Abstract

The subject of the paper is finding optimal setting of the laser power for the utility properties of the surface roughness parameter in the Additive technology by SLM method for differently large overhangs. The overhangs created on the sides, which are not supported by a supporting structure and are not designed in any way for printing by Additive technology. The samples were printed from stainless steel 316L (1.4404) under constant building parameters with change only of laser power. In total three laser power sizes were tested on differently large overhangs. The surface roughness parameters were measured and evaluated on the lower side of the overhang. The quality of the surface roughness parameter shows the suitability of overhangs in cases where it is not possible to add supporting construction. In conclusion, the most appropriate laser power was determined in relation to the size of the overhang and its surface roughness parameter.

Keywords: laser power, SLM, overhang, angles, stainless steel

© This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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