Increasing demand on materials characterization together with improvements in apparatus testing lead to the development of new testing procedures such as sub-size specimens testing. Miniaturized specimens allow reliable properties determination while using very small amount of material.These methods are widely used for local material properties determination. Basically, there are two main applications in industry: firstly, the determination of the distribution of mechanical properties in heterogeneous materials (e.g. heterogeneous weldments or weld deposits) and secondly the characterization of stamping parts which are usually too thin for the production of standard testing samples.Other applications are also important, e.g. anisotropy determination on thin components, residual service life evaluation, or new materials development when there is a lack of material (e.g. severe plastic deformation).In the last few years, a new methodology using small samples for tensile properties determination at RT has been developed. The newly proposed specimen is derived from the SPT specimen which has a diameter of 8 mm and a thickness of 0.5 mm. Therefore, the newly proposed specimen size is very small in comparison to standard size specimens and thus the new methodology is named a Micro-Tensile Test (M-TT). For precise strain measurement the ARAMIS system using the Digital Image Correlation method (DIC) is used.Moreover, as many components are operated at elevated temperature, it was necessary to develop a Hot Micro-Tensile Test for tensile properties determination at elevated temperature. This paper presents the possibilities of performing the M-TT at elevated temperatures while maintaining high measurement precision.Keywords: Tensile test, micro-tensile test, hot micro-tensile test, digital image correlation (DIC), small punch test
© This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.